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NEW OLYMPUS VANTA IX IN-LINE XRF ANALYZER SALE!!

The new Vanta iX inline X-ray fluorescence (XRF) analyzer from Olympus automates material analysis and alloy ID on the manufacturing line, delivering instant results for real-time process monitoring and 100% inspection. Designed to operate 24/7, the analyzer provides material and grade ID in seconds. It delivers pass/fail results or full material chemistry. With a silicon drift detector and the company’s Axon Technology, the analyzer can test a variety of alloy and metal grades.
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The Vanta iX analyzer can add value and reduce reworks in the inspection process since it verifies that a test material is what it is supposed to be. Nothing beats the confidence derived from 100% automated inspection. In-line, automated XRF eliminates the mistakes made by inspector fatigue or human error. In fact, one of our customers did a study and found that 100% manual inspection only caught 66% of the errors.

The Olympus Vanta iX in-line X-ray fluorescence (XRF) analyzer gives you confidence in your products by automating material analysis and alloy identification on the manufacturing line:

  • Delivers instant results for real-time process monitoring and 100% inspection
  • Built to operate 24/7
  • Configured to deliver pass/fail results, accurate grade ID, and material chemistry


100% Inspection for Metal Fabrication of Tubes, Bars, and Rods
For organizations adopting Industry 4.0 practices and 24/7 process control to verify alloys with pass/fail analysis, the Vanta iX analyzer delivers material verification and lot/heat control for bar, billet, tube, and rod manufacturing, as well as machined parts and customized components. Automating your testing with a Vanta iX analyzer adds a competitive edge to your finished product since you can demonstrate that materials are 100% tested and verified.

Scanning and Monitoring for Ore Grade Control in Mining
For geological processing and mining, the Vanta iX analyzer enables core scanning and on-belt analysis with real-time results to monitor process variability and ensure ore grade consistency. During on-belt analysis, the analyzer provides blending verification and process validation of concentrates.

Easily Integrates into a Variety of Production Systems
The Vanta iX analyzer is versatile, compact, and easy to install—use the mounting holes on each side to mount the analyzer onto robotics and other systems. There is no external control box, so you can easily control the analyzer with either the Vanta Connect API or a PLC and discrete wire.
 
Connector options:

  • Ethernet (RJ-45), enabling Power over Ethernet
  • USB
  • Discrete I/O (16 pins
  • AUX DC power

 
Rugged for Greater Uptime in Manufacturing Environments
The Vanta iX analyzer is built to endure the high levels of vibration, electromagnetic and acoustical noise, dust, and moisture of production facilities for increased reliability and uptime. 

  • Vibration tested (MIL-STD)
  •  IP54 rated
  • Designed to operate from –10 °C to 50 °C (14 °F to 122 °F) with continuous testing

A built-in heat sink lowers the internal temperature, while fan attachment points are available if additional cooling is needed. The analyzer offers toolless window changes for fast maintenance.

Vanta iX Specifications

Dimensions (W × H × D)10 cm × 7.9 cm × 26.6 cm (3.9 in. × 3.1 in. × 10.5 in.)
Weight2.4 kg (5.29 lb)
Excitation SourceX-ray tube: Rh or W anode (application optimized) 5–200 μA
MR model: 8–50 keV (4 W max)
CW model: 8–40 keV (4 W max)
Primary Beam FiltrationEight filter positions automatically selected per beam per method
DetectorMR model: Large-area silicon drift detector
CW model: Standard silicon drift detector
PowerPower over Ethernet (PoE) or 18 V AC power adaptor
Elemental RangeMethod dependent:
MR model: Mg–U
CW model: Ti–U (with standard window and calibration)
Pressure CorrectionBuilt-in barometer for automatic altitude and air pressure correction
IP RatingIP54
Operating EnvironmentTemperature range: –10 °C to 50 °C (14 °F to 122 °F) under continuous duty cycle
Humidity: 10% to 90% relative humidity, non-condensing
Operating SystemLinux
Application SoftwareOlympus proprietary data acquisition and processing package
  • Availability: 10 In Stock
  • Model: NEW OLYMPUS VANTA IX IN-LINE XRF ANALYZER
  • Brand: OLYMPUS

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