Latest Products
-
NEW GSSI STRUCTURESCAN MINI XT GPR SALE!!
4,692.50€
-
NEW GSSI STRUCTURESCAN PRO SIR 4000 SALE!!
3,847.85€
-
NEW GSSI STRUCTURESCAN MINI LXT GPR SALE!!
3,284.75€
-
NEW GSSI UTILITYSCAN PRO GPR SALE!!
6,287.95€
-
NEW MALA GROUND EXPLORER GX HDR GPR SALE!!
5,724.85€
-
NEW MALA EASY LOCATOR CORE INTELLIGENT GROUND PENETRATING RADAR (GPR) SALE!!
10,417.35€
-
NEW MALA EASY LOCATOR PRO WIDERANGE HDR DUAL FREQUENCY SALE!!
6,569.50€
-
USED US RADAR QUANTUM IMAGER TRIPLE FREQUENCY GPR SYSTEM SALE!!
4,692.50€
Oxford Instruments new X-MET5100 takes the analytical performance of hand-held XRF to a completely new level. X-MET5100 combines Oxford Instruments ground-breaking Silicon Drift Detector (SDD) with a powerful 45kV X-ray tube. This technology enables the analysis of light elements such as Mg, Al, and Si without the need for a vacuum or helium attachments.
X-MET hand-held XRF analysers are specifically designed for:
- positive material identification (PMI)
- metal identification/scrap sorting
- analysis of alloys and hazardous material analysis (RoHS screening)
- analysis of heavy metals in soils on polluted lands and ores at mining sites
- screening for lead in toys
- detection of lead in paint
Advantages:
- Closed beam operation for increased radiation safety
- Improved measurement precision
- Simplified sample positioning
- Simplified and more comfortable operation when measuring many samples
At the pull of a trigger, the X-MET5000 and X-MET5100 X-ray fluorescence (XRF) analysers provide fast, highly accurate, on-the-spot sample screening and analysis. The need for expensive laboratory testing is minimal. X-MET enables GPS integration for real-time correlation of measurement data and location coordinates.
- Accurate and reliable identification of heavy element pollutants
- Define the extremities of ‘hotspots’ in seconds
- Easy data transfer to PC assures maximum efficiency and minimum errors when working on-site
- Pre-sort contaminated soil to minimize remediation costs
- Soil remediation decisions made instantly
- Fast and reliable Go/No-Go decisions,and fully configurable Pass/Fail alarms
Specifications:
Manufacturer | Oxford Instruments |
Product Name | X-MET 5100 |
Detection Category | Chemical |
Detection Principle | Elemental Analysis; |
Detection Method | X-ray Fluorescence; |
Application | Emergency Response; Laboratory Analysis; |
Equipment Type | Instrument |
Product Synopsis | Oxford Instruments’ X-MET5100 combines Oxford Instruments Silicon Drift Detector (SDD) with a 45kV X-ray tube. This technology enables the analysis of light elements such as Mg, Al, and Si without the need for a vacuum or helium attachments. |
Availability | DISCONTINUED |
Technology Readiness Level (TRL) | 9 |
Dimensions | 11.8 x 10.6 x 3.5 in (30 x 27 x 9 cm) |
Weight | <5 lbs.; 3.7 lbs (1.7 kg) |
Power Requirements | AC/DC Line Power; Lithium Battery; Battery, and AC power through the battery charger |
Transportability | Handheld |
Ruggedness | Extreme Temperatures/Humidity; drop sensitive |
Operating Conditions | –10 to 50°C. May be affected by high humidity extremes. |
Consumables | <$1,000/year; Measurement window, Batteries |
Calibration Schedule | Performed by the user |
Communications Interface | Serial cable, USB adaptor can be purchased. |
Other Chemical Targets | Programmed to detect elements Mg-U |
Sample Introduction | Solid |
Sensitivity/Detection Limits | ppm |
Start Up Time (From Cold Start To Sample Ready) | 1 minute |
Response Time (Sample Application To Output) | <1 minute; 3 seconds and up |
Alarm Capability | Visual response |
Software Control | On-board, PC |
Other Operational Parameters | New libraries can be programmed to account for changes in the density of materials. |
Training Required | <1 day training |
Training Available | Training available for basic and advanced users |
Manuals Available | Operator’s Manual and a Quick Start Guide |